STMicroelectronics 3-Axis Surface Accelerometer 1.71 V 2.1 V, I2C, TDM, LGA-14L, 14-Pin

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Subtotal (1 reel of 5000 units)*

PHP1,955,645.00

(exc. VAT)

PHP2,190,320.00

(inc. VAT)

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Units
Per Unit
Per Reel*
5000 - 5000PHP391.129PHP1,955,645.00
10000 - 10000PHP383.306PHP1,916,530.00
15000 +PHP375.64PHP1,878,200.00

*price indicative

RS Stock No.:
252-3647
Mfr. Part No.:
AIS25BATR
Manufacturer:
STMicroelectronics
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Brand

STMicroelectronics

Product Type

Accelerometer

Sensor Type

Accelerometer

Number of Axis

3

Technology

Digital

Mount Type

Surface

Interface Type

I2C, TDM

Minimum Supply Voltage

1.71V

Package Type

LGA-14L

Maximum Supply Voltage

2.1V

Minimum Operating Temperature

-40°C

Sensitivity

0.12mg/LSB

Maximum Operating Temperature

125°C

Pin Count

14

Height

0.86mm

Series

AIS25BA

Length

2.5mm

Width

2.5 mm

Standards/Approvals

RoHS

Automotive Standard

AEC-Q100

The STMicroelectronics MEMS digital output motion sensor: low noise, high bandwidth, 3-axis accelerometer with TDM interface is an ultralow noise, low latency, wide bandwidth, 3-axis digital accelerometer with a dedicated TDM interface designed to address automotive non-safety applications, in particular, wideband active noise control (ANC) and vibration monitoring. The AIS25BA has a user-selectable full-scale range of ±3.85/±7.7 g, a time-division multiplexing (TDM) interface for the sensor data, and an I²C interface for device configuration.

The AIS25BA is available in a small thin plastic land grid array package (LGA) and is guaranteed to operate over an extended temperature range from -40 °C to +125 °C.

3-axis accelerometer with user-selectable full-scale is ±3.85/±7.7 g

Wide and flat frequency response is from dc up to 2.4 kHz (typ)

Low latency (entire reading chain) is 266 μs @ 2 kHz (typ)

Ultralow noise density (typ: 30 μg/√Hz for X and Y axes; 50 μg/√Hz for Z-axis)

TDM (8/16/24 kHz) slave interface for sensor data and I²C interface for configuration

Supply voltage is 1.71 V to 2.1 V

Extended temperature range from -40 °C to +125 °C

Embedded self-test

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