Keysight Technologies U2722A Function Generator, Variable Sweep

The Keysight Technologies modular source measure unit is a 3-channel, 20V/120mA source and measure unit that can operate in a 4-quadrant operation acting as a current source and also as current sink (load) with both polarities of the output voltage. This device well suited for a wide range of test applications including leakage measurement, solar cell measurement, forward/reverse voltage, curve tracer transistor and many others. It has an Agilent USB modular source measure unit which is more than just a power supply. It has a fast response time and has voltage and current programming/read back with high accuracy measurement capabilities. This generator is a versatile device that allows you to perform sweep and measurement from different operating regions with just a single device without extra configurations. Besides being versatile, this counter-generator offers high measurement sensitivity with high resolution and accuracy that allows you to obtain more accurate analysis and measurement results. It is supplied with 12V, 3A AC/DC power adaptor, power cord, plug-in connectors and cable casing, USB Standard-A to Mini-B interface cable, L-mount kit (for use with modular product chassis 686-2075), automation-ready CD-ROM, USB modular products quick start guide, reference CD-ROM and quick reference card, certificate of calibration.

3 channel source measure unit and 4 quadrant (±20V)
16-bit resolution for all voltage and current ranges with high measurement sensitivity
High current sensitivity of 100pA with 16-bit resolution
Basic accuracy is 0.1%
Low current measurement capability down to nA levels
Voltage and current programming/read back
High-speed USB 2.0, USBTMC-U
Standalone and modular capabilities
Command logger
Self-test and Self-calibration
Option to save the current instrument configuration to a file
Data logging and export feature to CSV, HTML and text only format files that can be printed
Trigger settings between modules in the instrument chassis with Star trigger and Master/Slave trigger

Integrated electronic testing
Educational institutions
Embedded systems
Digital circuits
Analogue signal processing
Laboratories

IEC 61010-1:2001/EN 61010-1:2001
IEC 61326-1:2002/EN 61326-1:1997